E. Hugonnard-Bruyere

New SiC on Insulator Wafers Based on the Smart-Cut® Approach and their Potential Applications

Bernard Aspar, L. Di Cioccio, F. Letertre, 2002 .

Deep level defects in H+ implanted 6H–SiC epilayers and in silicon carbide on insulator structures

G. Guillot, C. Jaussaud, V. Lauer, 1999 .

Silicon Carbide on Insulator Formation by the Smart CUT® Process

M. Bruel, L. Di Cioccio, C. Jaussaud, 1997 .

Analysis and optimization of lateral thin-film Silicon-on-insulator (SOI) MOSFET transistors

G. Toulon, Ignasi Cortés, Frederic Morancho, 2012, Microelectron. Reliab..

Defect studies in epitaxial SiC-6H layers on insulator (SiCOI)

T. Ouisse, J. Cantin, H. Bardeleben, 1999 .