F. Rüdenauer

发表

A Comparison of Quantitative Models for SIMS Analysis

F. Rüdenauer, 1977 .

The binary alloy system Au/Pd; a SIMS study

W. Steiger, H. Gnaser, J. Marton, 1982 .

Collision cascade limit to spatial resolution in focused ion beam processes

G. Betz, F. Rüdenauer, 1991 .

Localized ion beam induced deposition of Al‐containing layers

W. Steiger, F. Rüdenauer, D. Schrottmayer, 1988 .

Operational Data of a Simple Microfocus Gun Using an EHD-Type Indium Ion Source

F. Rüdenauer, M. Higatsberger, P. Pollinger, 1982 .

Field emission devices for space applications

F. Rüdenauer, 2007 .

Spatially multidimensional secondary ion mass spectrometry analysis

F. Rüdenauer, 1994 .

Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends

H. W. Werner, A. Benninghoven, H. Werner, 1987 .

Secondary ion mass spectrometry (Chemical analysis, vol. 86.) : Wiley, New York, 1987 (ISBN 0-471-01056-1). xxxv+1227 pp. Price £143.00

A. Benninghoven, H. Werner, F. Rüdenauer, 1987 .

Fabrication of submicron deep ultraviolet masks by ion microprojection

Hans Loschner, W. Maurer, Gerhard Stengl, 1985 .

Spatially multidimensional SIMS analysis

F. Rüdenauer, 1984 .

Molecular dynamics study of sputtering of Cu (111) under Ar ion bombardment

H. Urbassek, W. Husinsky, G. Betz, 1994 .

Mass and energy spectra of a capillary-type indium liquid-metal ion source

W. Steiger, F. Rüdenauer, P. Pollinger, 1987 .

Positive secondary ion yields under In+- and O2+-bombardement

H. Gnaser, F. Rüdenauer, 1983 .

A quantitative model for the interpretation of secondary ion mass spectra of dilute alloys

W. Gries, F. Rüdenauer, 1975 .

Secondary Ion Emission from Binary and Ternary Amorphous Alloys

M. Riedel, H. Gnaser, J. Marton, 1982 .

Instrumental Aspects of Spatially 3-Dimensional SIMS Analysis

F. Rüdenauer, 1982 .

New Developments in Spatially Multidimensional Ion Microprobe Analysis

W. Steiger, Hubert Gnaser, W. Steiger, 1983 .