Laurent Bary

发表

Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements

Yuan Gao, Nicolas Guitard, Laurent Escotte, 2007, Microelectron. Reliab..

Smart MEMS concept for high secure RF and millimeterwave communications

David Dubuc, Ali Boukabache, Patrick Pons, 2004, Microelectron. Reliab..

Design ofaX-band GaNoscillator: fromthelowfrequency noise device characterization andlarge signal modeling tocircuit design

J. Graffeuil, Laurent Bary, Jean-Guy Tartarin, 2006 .

Current mode charge sensitive amplifying technique providing noise performance independent of the radiation detector capacitance

Stylianos Siskos, Thomas Noulis, Laurent Bary, 2009, 2009 3rd International Workshop on Advances in sensors and Interfaces.

Electrostatic discharge failure analysis of capacitive RF MEMS switches

Robert Plana, Fabio Coccetti, Jinyu Jason Ruan, 2007, Microelectron. Reliab..

SiGe HBT Nonlinear Phase Noise Modeling - X-band amplifier design

Olivier Llopis, Laurent Bary, Sébastien Gribaldo, 2008 .

Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications

Philippe Perdu, David Trémouilles, Nicolas Guitard, 2004, Microelectron. Reliab..

Failure predictive model of capacitive RF-MEMS

David Dubuc, Olivier Vendier, Laurent Bary, 2005, Microelectron. Reliab..

Advanced Low-Noise X-Ray Readout ASIC for Radiation Sensor Interfaces

Stilianos Siskos, Gérard Sarrabayrouse, Thomas Noulis, 2008, IEEE Transactions on Circuits and Systems I: Regular Papers.

Millimeter wave carbon nanotube gas sensor

David Dubuc, Robert Plana, Katia Grenier, 2007 .

Carrier’s transport mechanisms investigations inAlGaN/GaN HEMT thanks to physical modelling andlow frequency noise measurements

Robert Plana, Sylvain Delage, Geoffroy Soubercaze-Pun, 2004 .

Dry followed by wet backside etching processes for micromachined endfire antennae

Patrick Pons, Robert Plana, D. Vasilache, 2005 .

Experimental determination of microwave attenuation and electrical permittivity of double-walled carbon nanotubes

David Dubuc, Robert Plana, Katia Grenier, 2006 .

Generation-Recombination Defects In AlGaN/GaN HEMT On SiC Substrate, Evidenced By Low Frequency Noise Measurements And SIMS Characterization

Geoffroy Soubercaze-Pun, Laurent Bary, Jean-Guy Tartarin, 2007 .

Noise behavior in SiGe devices

L. Escotte, J. Graffeuil, Mattia Borgarino, 2001 .

SiGe HBT Nonlinear Phase Noise Modeling

Olivier Llopis, Laurent Bary, Sébastien Gribaldo, 2007 .