K. Ogawa

Current gain deterioration in carbon-doped AlGaAs/GaAs heterojunction bipolar transistors during high-temperature bias stress tests

O. Nakajima, K. Nagata, T. Ishibashi, 1994 .

Improved reliability of AlGaAs/GaAs heterojunction bipolar transistors with a strain-relaxed base

Hirohiko Sugahara, Takumi Nittono, T. Nittono, 1993, 15th Annual GaAs IC Symposium.

Electroluminescence spectra of rare-earth-doped ZnS1-xSex thin films

R. Nakano, N. Miura, K. Ogawa, 1994 .