Martin M. Frank

发表

High-k/metal gate innovations enabling continued CMOS scaling

Martin M. Frank, M. Frank, 2011, 2011 Proceedings of the ESSCIRC (ESSCIRC).

Beyond Silicon Technology: Materials and Devices for Post-Si CMOS: Proceedings E-MRS 2008 Spring Conference Symposium J

Cor Claeys, Martin M. Frank, Tony Peaker, 2008 .

Reliability Challenges with Materials for Analog Computing

Geoffrey W. Burr, Paul M. Solomon, Tayfun Gokmen, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).

Emerging Neural Workloads and Their Impact on Hardware

Carole-Jean Wu, Michael Niemier, Tayfun Gokmen, 2020, 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Electron mobility in thin In0.53Ga0.47As channel

X. Sun, C.-C. Yeh, Martin M. Frank, 2017, 2017 47th European Solid-State Device Research Conference (ESSDERC).

Germanium channel MOSFETs: Opportunities and challenges

Martin M. Frank, Stephen W. Bedell, Evgeni P. Gusev, 2006, IBM J. Res. Dev..

Advanced high-k dielectric stacks with polySi and metal gates: Recent progress and current challenges

Martin M. Frank, Vijay Narayanan, Evgeni P. Gusev, 2006, IBM J. Res. Dev..

PBTI in InGaAs MOS capacitors with Al2O3/HfO2/TiN gate stacks: Interface-state generation

Martin M. Frank, Takashi Ando, Vijay Narayanan, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

Epitaxial strontium oxide layers on silicon for gate-first and gate-last TiN/HfO2 gate stack scaling

Martin M. Frank, Chiara Marchiori, Jean Fompeyrine, 2011 .

Hafnium oxide gate dielectrics on sulfur-passivated germanium

Martin M. Frank, John A. Ott, Huiling Shang, 2006 .

Scaling the MOSFET gate dielectric: From high-k to higher-k? (Invited Paper)

Martin M. Frank, Michael P. Chudzik, Vijay Narayanan, 2009 .

Absence of magnetism in hafnium oxide films

Martin M. Frank, Supratik Guha, David W. Abraham, 2005 .

Mechanistic Studies of Dielectric Growth on Silicon

Martin M. Frank, Yves J. Chabal, Y. Chabal, 2005 .

Quasi-damascene metal gate/high-k CMOS using oxygenation through gate electrodes

Martin M. Frank, Eduard A. Cartier, Takashi Ando, 2009 .

Germanium Surface Conditioning and Passivation

Martin M. Frank, Sonja Sioncke, Yves J. Chabal, 2011 .

High-k / metal gate innovations enabling continued CMOS scaling

Martin M. Frank, 2011 .

HfO2 and Al2O3 gate dielectrics on GaAs grown by atomic layer deposition

David A. Muller, Martin M. Frank, Dmitri Starodub, 2005 .

The Quantum Metal Ferroelectric Field-Effect Transistor

David J. Frank, Paul M. Solomon, Catherine Dubourdieu, 2014, IEEE Transactions on Electron Devices.

The relationship between local order, long range order, and sub-band-gap defects in hafnium oxide and hafnium silicate films

Deane Chandler-Horowitz, Albert V. Davydov, Martin M. Frank, 2008 .

Nucleation and interface formation mechanisms in atomic layer deposition of gate oxides

Martin M. Frank, Glen D. Wilk, Yves J. Chabal, 2003 .

Erratum: Switching of ferroelectric polarization in epitaxial BaTiO 3 films on silicon without a conducting bottom electrode (Nature Nanotechnology (2013) 8 (748-754))

David J. Frank, Catherine Dubourdieu, Alexander A. Demkov, 2013 .

Gas phase chlorination of hydrogen-passivated silicon surfaces

Sandrine Rivillon, Martin M. Frank, Yves J. Chabal, 2004 .

Impact of metal gates on remote phonon scattering in titanium nitride/hafnium dioxide n-channel metal–oxide–semiconductor field effect transistors–low temperature electron mobility study

Veena Misra, Martin M. Frank, Eduard A. Cartier, 2007 .

On the location and magnitude of trapped charge in poly- Si ALD-Al2O3 capped Hf-silicate gate stacks

Barry P. Linder, Martin M. Frank, Eduard A. Cartier, 2005 .

Incorporation of la in epitaxial SrTiO3 thin films grown by atomic layer deposition on SrTiO3-buffered Si (001) substrates

Alexander A. Demkov, John G. Ekerdt, Martin M. Frank, 2014 .

Enhanced initial growth of atomic-layer-deposited metal oxides on hydrogen-terminated silicon

Martin M. Frank, Annelies Delabie, Bert Brijs, 2003 .

Structural, optical, and electrical properties of strained La-doped SrTiO3 films

Alexander A. Demkov, Martin M. Frank, Stefan Zollner, 2014 .

Sub-bandgap defect states in polycrystalline hafnium oxide and their suppression by admixture of silicon

Deane Chandler-Horowitz, Albert V. Davydov, Martin M. Frank, 2005 .