Young Dong Kim

发表

Performance Analysis of Limited Service Token Ring LAN with Message Priority

Young Dong Kim, 1990 .

Growth and in situ analysis of InAs/InP quantum dot stack and its far infrared absorption properties

Euijoon Yoon, Young Dong Kim, Heedon Hwang, 2003, SPIE OPTO.

해부학적인 구조에 근거한 손가락 관절 위치 추정 기법 = An inter-phalangeal joint position estimation algorithm based on its anatomical structure

김영동, Young Dong Kim, 2016 .

End-to-End Performance of VoIP based on Mobility Pattern over MANETs

Young Dong Kim, 2009, J. Inform. and Commun. Convergence Engineering.

Three‐dimensional Nano‐object Recognition by use of Phase Sensitive Scatterometry

Bahram Javidi, Young Dong Kim, Daesuk Kim, 2007 .

A framework for haptic rendering system using 6-DOF force-feedback device

Dae-Hyun Kim, Nak Yong Ko, Young Dong Kim, 2001, Proceedings 2001 ICRA. IEEE International Conference on Robotics and Automation (Cat. No.01CH37164).

Precision auto-alignment for the specimen stage of an ellipsometer

Young Dong Kim, D. Gweon, Sunglim Park, 2002 .

Optical characterization of GaAs/AlAs short period superlattices

Young Dong Kim, S. H. Kim, I. Han, 1998 .

Effect of incidence angle and polarization on the optimized layer structure of organic solar cells

Jin Jang, Tae Jung Kim, Young Dong Kim, 2013 .

Temperature dependence of the critical points of monolayer MoS2 by ellipsometry

Tae Jung Kim, Young Dong Kim, M. Seong, 2016 .

Modeling of the Optical Properties of Monolayer WS2

Tae Jung Kim, Young Dong Kim, V. L. Le, 2020, Journal of the Korean Physical Society.

Parameterized optical properties of monolayer MoSe2

Tae Jung Kim, Young Dong Kim, Han Gyeol Park, 2019, AIP Advances.

Parameterization of the dielectric function of InP from 1.19 to 6.57 eV for temperatures from 25 to 700 K

Tae Jung Kim, Young Dong Kim, J. S. Byun, 2012 .

Parameterization of the dielectric functions of InGaSb alloys

Tae Jung Kim, Young Dong Kim, J. S. Byun, 2014 .

Parameterization of the dielectric function of InxAl1−xAs alloys as a function of composition

Tae Jung Kim, Young Dong Kim, K. Nam, 2015 .

Temperature dependence of the dielectric function and critical points of α-SnS from 27 to 350 K

Tae Jung Kim, Young Dong Kim, Wonjun Lee, 2020, Scientific Reports.

Temperature dependence of the dielectric functions and the critical points of InSb by spectroscopic ellipsometry from 31 to 675 K

Tae Jung Kim, Young Dong Kim, J. S. Byun, 2013 .

3D Nano Object Recognition based on Phase Measurement Technique

Bahram Javidi, Young Dong Kim, Byung Joon Baek, 2007 .

Reinforcement of interfacial adhesion of a coated polymer layer on a cobalt-chromium surface for drug-eluting stents.

Tae Jung Kim, Young Dong Kim, Bang Ju Park, 2014, Langmuir : the ACS journal of surfaces and colloids.

Effects of As/P exchange reaction on the formation of InAs/InP quantum dots

Euijoon Yoon, Young Dong Kim, Sukho Yoon, 1999 .

Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling

Yia-Chung Chang, James N. Hilfiker, Gong-Ru Lin, 2008 .

Optical Properties of GaN by Using Ellipsometry and a Band Calculation

Tae Jung Kim, Young Dong Kim, J. S. Byun, 2008 .

Dielectric functions and interband transitions of InxAl1 - xP alloys

Tae Jung Kim, Young Dong Kim, J. S. Byun, 2014 .

Temperature dependence of the dielectric function and critical-point energies of InAs

Tae Jung Kim, Young Dong Kim, J. S. Byun, 2012 .

Dielectric function spectra at 40 K and critical-point energies for CuIn0.7Ga0.3Se2

Tae Jung Kim, Young Dong Kim, L. Mansfield, 2012 .

Parametric modeling of the dielectric function and identification of the critical point of a CdMgTe alloy in the vacuum ultraviolet spectral range

Tae Jung Kim, Young Dong Kim, Yia-Chung Chang, 2012 .

InAs critical-point energies at 22 K from spectroscopic ellipsometry

Tae Jung Kim, Young Dong Kim, Yia-Chung Chang, 2010 .

Pseudodielectric functions of InGaAs alloy films grown on InP

Tae Jung Kim, Young Dong Kim, K. Shim, 2002 .

Stepwise fluorescence changes of quantum dots: single-molecule spectroscopic studies on the properties of turn-on quantum dots.

Tae Jung Kim, Young Dong Kim, S. Hah, 2012, Chemical communications.

Analytic determination of the dielectric function of InSb at energies from 0.74 to 6.42 eV at temperatures from 31 to 675 K

Tae Jung Kim, Young Dong Kim, J. S. Byun, 2014 .

Parameterized optical properties of InxAl1-xP alloys.

Tae Jung Kim, Young Dong Kim, Han Gyeol Park, 2020, Applied optics.

Optical properties and photo-oxidative degradation of regioregular poly(3-butylthiophene) films by spectroscopic ellipsometry

Tae Jung Kim, Young Dong Kim, J. S. Byun, 2013 .

Optical properties of (GaSb) 3n(AlSb) n (1≤n≤5) superlattices

Young Dong Kim, C. Palmstrøm, D. Aspnes, 2005 .

SPECTROSCOPIC ELLIPSOMETRIC CHARACTERIZATION OF UNDOPED ZNTE FILMS GROWN ON GAAS

Young Dong Kim, M. Klein, J. Furdyna, 1997 .

Three-Dimensional Analysis of the Collapse of a Fatty Acid at Various Compression Rates using In Situ Imaging Ellipsometry

Tae Jung Kim, Young Dong Kim, J. S. Byun, 2014 .

In-situ observation of As/P exchange reaction and As carryover in InAs/InP quantum well structures by surface photoabsorption

Young Dong Kim, E. Yoon, Y. Moon, 1998, 1998 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings (Cat. No.98EX140).

Analysis of ellipsometric and photoemission spectra of diluted magnetic semiconductors by hybridization interaction mechanism

Young Dong Kim, M. Klein, Yia-Chung Chang, 1998 .