J. Gaudestad

Failure Analysis Work Flow for Electrical Shorts in Triple Stacked 3D TSV Daisy Chains

I. De Wolf, J. Gaudestad, Antonio Orozco, 2015 .

Non-destructive open fault isolation in flip-chip devices with space-domain reflectometry

M. Y. Tay, M. S. Wei, S. C. Tan, 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Open localization on copper wirebond using Space Domain Reflectometry

J. Gaudestad, V. V. Talanov, A. Orozco, 2013, 2013 IEEE International Reliability Physics Symposium (IRPS).

High resolution Magnetic Current Imaging for die level short localization

J. Gaudestad, V. V. Talanov, N. Gagliolo, 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Failure analysis on resistive opens with Scanning SQUID Microscopy

J. Gaudestad, S. Hsiung, K.V. Tan, 2004, 2004 IEEE International Reliability Physics Symposium. Proceedings.

Space Domain Reflectometry for open failure localization

J. Gaudestad, N. Gagliolo, A. Orozco, 2012, 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.