Tomoyuki Shoji

Reliability Design for Neutron Induced Single-Event Burnout of IGBT

Kimimori Hamada, Tomoyuki Shoji, Shuichi Nishida, 2011 .

Theoretical Analysis on Temperature Dependency of Short-Circuit Capability

Tomoyuki Shoji, Masayasu Ishiko, Jun Saito, 2010 .

Cosmic ray ruggedness of IGBTs for hybrid vehicles

Kimimori Hamada, Tomoyuki Shoji, Shuichi Nishida, 2010, 2010 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD).

Analysis of neutron-induced single-event burnout in SiC power MOSFETs

Hiroshi Tadano, Kimimori Hamada, Tomoyuki Shoji, 2015, Microelectron. Reliab..

Cosmic Ray Ruggedness of Power Semiconductor Devices for Hybrid Vehicles

Kimimori Hamada, Tomoyuki Shoji, Shuichi Nishida, 2010 .

Spin reorientation transition and hard magnetic properties of MnBi intermetallic compound

Tomoyuki Shoji, Xiaodong Wu, Akira Kato, 2012 .

Cosmic ray neutron-induced single-event burnout in power devices

Hiroshi Tadano, Kimimori Hamada, Tomoyuki Shoji, 2015 .

Triggering Mechanism for Neutron Induced Single-Event Burnout in Power Devices

Kimimori Hamada, Tomoyuki Shoji, Shuichi Nishida, 2013 .

Theoretical analysis of short-circuit capability of SiC power MOSFETs

Hiroshi Tadano, Tomoyuki Shoji, T. Shoji, 2015 .