J. Mirabel
发表
C. Plossu,
P. Boivin,
N. Baboux,
2005
.
P. Gonon,
P. Fornara,
J. Jacquot,
2019,
2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS).
P. Albarède,
F. Nemouchi,
D. Mangelinck,
2003
.
P. Boivin,
C. Raynaud,
C. Plossu,
1999
.