O. Saxod

28nm FDSOI technology platform for high-speed low-voltage digital applications

O. Rozeau, D. Noblet, M. Rafik, 2012, 2012 Symposium on VLSI Technology (VLSIT).

Impact study of the process thermal budget of advanced CMOS nodes on SiGe HBT performance

D. Celi, P. Chevalier, T. Zimmer, 2015, 2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM.

First demonstration of a full 28nm high-k/metal gate circuit transfer from Bulk to UTBB FDSOI technology through hybrid integration

G. Bidal, N. Planes, O. Weber, 2013, 2013 Symposium on VLSI Circuits.

Characterization & modeling of gate-induced-drain-leakage with complete overlap and fringing model

D. Rideau, O. Saxod, C. Tavernier, 2010, 2010 International Conference on Microelectronic Test Structures (ICMTS).