J. Trager

Sources of error in electrical measurements of dimensional offset and sheet resistance in the near- and sub-micron region

J. Trager, 1990, International Conference on Microelectronic Test Structures.

Temperature Increase by Self-Heating in VLSI CMOS

D. Takacs, J. Trager, 1987, ESSDERC '87: 17th European Solid State Device Research Conference.

Self-heating and Temperature Measurement in Sub-μm-MOSFETs

J. Trager, P.G. Mautry, 1989, ESSDERC '89: 19th European Solid State Device Research Conference.

Investigation of self-heating in VLSI and ULSI MOSFETs

J. Trager, P.G. Mautry, J. Trager, 1990, International Conference on Microelectronic Test Structures.