Giuseppe Scardera

Noise consideration in an FTS for telecommunication applications

Jérôme Genest, Eric Lanoue, Giuseppe Scardera, 2003 .

Manufacturing metrology for c-Si photovoltaic module reliability and durability, Part I: Feedstock, crystallization and wafering

Narendra S. Shiradkar, Eric Schneller, Andrew C. Rudack, 2016 .

Effect of annealing temperature on the formation of silicon nanocrystals in a nitride matrix

Gavin Conibeer, Martin A. Green, Giuseppe Scardera, 2006, SPIE Micro + Nano Materials, Devices, and Applications.

A review of manufacturing metrology for improved reliability of silicon photovoltaic modules

Narendra S. Shiradkar, Eric Schneller, Andrew C. Rudack, 2014, Optics & Photonics - Solar Energy + Applications.

Manufacturing metrology for c-Si module reliability and durability Part III: Module manufacturing

Narendra S. Shiradkar, Eric Schneller, Andrew C. Rudack, 2016 .

Fourier transform infrared spectroscopy of annealed silicon-rich silicon nitride thin films

Gavin Conibeer, Martin A. Green, Giuseppe Scardera, 2008 .

Silicon quantum dot nanostructures for tandem photovoltaic cells

Gavin Conibeer, Martin A. Green, Shujuan Huang, 2008 .