D. Moon

Round‐robin test of medium‐energy ion scattering for quantitative depth profiling of ultrathin HfO2/SiO2/Si films

P. L. Grande, W. J. Min, Gabriel Marmitt, 2019, Surface and Interface Analysis.

Quantitative Analysis of Calcium Phosphate Nanocluster Growth Using Time-of-Flight Medium-Energy-Ion-Scattering Spectroscopy

Viet-Duc Le, K. Nam, Jimin Park, 2018, ACS central science.

Soft landing of bare PtRu nanoparticles for electrochemical reduction of oxygen.

M. Engelhard, R. Colby, J. Laskin, 2015, Nanoscale.

Quantitative compositional profiling of conjugated quantum dots with single atomic layer depth resolution via time-of-flight medium-energy ion scattering spectroscopy.

Hyunung Yu, P. L. Grande, M. Sortica, 2014, Analytical chemistry.

Surface characterization of nanomaterials and nanoparticles: Important needs and challenging opportunities.

Suntharampillai Thevuthasan, Julia Laskin, Alison Elder, 2013, Journal of vacuum science & technology. A, Vacuum, surfaces, and films : an official journal of the American Vacuum Society.

Investigation of Cs surface layer formation in Cs‐SIMS with TOF‐MEIS and SIMS

N. Mine, C. Noël, L. Houssiau, 2014 .

Identification of donor deactivation centers in heavily As-doped Si using time-of-flight medium-energy ion scattering spectroscopy

Yong-Sung Kim, W. J. Min, D. Moon, 2015 .