A. M. Reddy

发表

Oxygen Partial Pressure Dependent Properties of Nanocrystalline Nickel Oxide Films

P. S. Reddy, Y. Reddy, A. S. Reddy, 2013 .

Planarized thick copper gate polycrystalline silicon thin film transistors for ultra-large AMOLED displays

S. Joo, S. Son, C. Byun, 2012, Electronic Materials Letters.

Preparation and Characterization of NiO Thin Films by DC Reactive Magnetron Sputtering

P. S. Reddy, K. Reddy, A. S. Reddy, 2012 .

Growth and characterization of NiO thin films prepared by dc reactive magnetron sputtering

P. S. Reddy, Kee-Sun Lee, A. S. Reddy, 2011 .

Preparation and characterization of Nickel Oxide thin films by direct current reactive magnetron sputtering at different substrate temperatures

P. S. Reddy, S. Joo, C. Byun, 2014, Electronic Materials Letters.

Thickness dependent properties of nickel oxide thin films deposited by dc reactive magnetron sputtering

P. S. Reddy, A. S. Reddy, A. M. Reddy, 2011 .

Effect of substrate bias voltage on the physical properties of dc reactive magnetron sputtered NiO thin films

P. S. Reddy, A. S. Reddy, A. M. Reddy, 2011 .

Effect of Process Deviations on Performance of Piezoresistive Pressure Sensors

K. Rajanna, A. Mallikarjuna Reddy, K. Rajanna, 2014, IEEE Transactions on Semiconductor Manufacturing.

Effect of Ni silicide density on electrical performance of silicide-induced crystallized polycrystalline silicon thin-film transistors

S. Joo, S. Son, C. Byun, 2012, Electronic Materials Letters.

Sputtered Nickel Oxide Films for NO2 Gas Sensors

P. S. Reddy, A. S. Reddy, A. M. Reddy, 2013 .

Annealing Effect on the Physical Properties of dc Reactive Magnetron Sputtered Nickel Oxide Thin Films

P. S. Reddy, A. S. Reddy, A. M. Reddy, 2013 .

Effect of oxygen partial pressure on the structural, optical and electrical properties of sputtered NiO films

P. S. Reddy, Kee-Sun Lee, A. S. Reddy, 2011 .