Bo Tang
发表
E. Simoen,
Z. Ji,
A. Du,
2020,
IEEE Transactions on Device and Materials Reliability.
Tianchun Ye,
E. Simoen,
H. Yin,
2018,
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Jiang Yan,
Wenwu Wang,
Jun Du,
2016,
Nanoscale Research Letters.
Hongyu Yu,
Huilong Zhu,
Chao Zhao,
2015,
IEEE Electron Device Letters.
H. Yin,
Wenwu Wang,
Qingzhu Zhang,
2022,
Nanoscale research letters.
A. Du,
Junfeng Li,
H. Yin,
2023,
IEEE Electron Device Letters.
Jiang Yan,
Jun Du,
Y. Xiong,
2015
.
Tianchun Ye,
Jun Luo,
Jianfeng Gao,
2015
.
Tianchun Ye,
Bo Tang,
Eddy Simoen,
2018,
IEEE Electron Device Letters.
Tianchun Ye,
Yefeng Xu,
Junfeng Li,
2016
.
Jiang Yan,
Jun Du,
Y. Xiong,
2016,
Journal of Electronic Materials.
E. Simoen,
Z. Ji,
Jun Luo,
2020,
IEEE Electron Device Letters.