K. Maekawa

Revisited study of fluorine implantation impact on negative bias temperature instability for input/output device of automotive micro controller unit

Y. Yamaguchi, Tatsuo Shimizu, S. Tsuda, 2018 .

Development of Evaluation Method for Estimating Stress-Induced Change in Drain Current in Deep-submicron MOSFETs *

S. Kamohara, H. Miura, A. Shimizu, 2007 .

Development of Evaluation Method for Estimating Stress-Induced Change in Drain Current in Deep-sub-micron MOSFETs

S. Kamohara, H. Miura, A. Shimizu, 2006 .

Development of highly reliable static random access memory for 40-nm embedded split gate-MONOS flash memory

A. Nishida, Y. Kawashima, M. Inoue, 2015 .

A 65nm Silicon-on-Thin-Box (SOTB) Embedded 2T-MONOS Flash Achieving 0.22 pJ/bit Read Energy with 64 MHz Access for IoT Applications

Hiroyuki Kondo, Takashi Kono, Hidenori Mitani, 2019, 2019 Symposium on VLSI Circuits.

A 2T-MONOS Embedded Flash Macro With 65-nm SOTB Technology Achieving 0.15-pJ/bit Read Energy With 80-MHz Access for IoT Applications

Takashi Ito, Hiroyuki Kondo, Takashi Kono, 2020, IEEE Solid-State Circuits Letters.

Ultralow-voltage design and technology of silicon-on-thin-buried-oxide (SOTB) CMOS for highly energy efficient electronics in IoT era

Hideharu Amano, Kazutoshi Kobayashi, Kimiyoshi Usami, 2014, 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.

A Perpetuum Mobile 32bit CPU with 13.4pJ/cycle, 0.14µA sleep current using Reverse Body Bias Assisted 65nm SOTB CMOS technology

Hideharu Amano, Duc-Hung Le, Cong-Kha Pham, 2014, 2014 IEEE COOL Chips XVII.

Comprehensive analysis of low-frequency noise variability components in bulk and fully depleted silicon-on-insulator metal–oxide–semiconductor field-effect transistor

Tomohiro Yamashita, Keiichi Maekawa, Shiro Kamohara, 2018 .

40 nm Dual-port and two-port SRAMs for automotive MCU applications under the wide temperature range of −40 to 170°C with test screening against write disturb issues

Koji Nii, Koji Tanaka, Yuichiro Ishii, 2014, 2014 IEEE Asian Solid-State Circuits Conference (A-SSCC).