S. Goyal
发表
T. Siegmund,
G. Subbarayan,
S. Goyal,
2010,
2010 IEEE International Reliability Physics Symposium.
Estimating the Yield Strength of Thin Metal Films Through Elastic–Plastic Buckling-Induced Debonding
T. Siegmund,
G. Subbarayan,
S. Goyal,
2011,
IEEE Transactions on Device and Materials Reliability.
T. Siegmund,
G. Subbarayan,
S. Goyal,
2010
.
T. Siegmund,
G. Subbarayan,
S. Goyal,
2010
.
Ganesh Subbarayan,
Kartik Srinivasan,
Qinghuang Lin,
2009,
IBM J. Res. Dev..