Michael J. Ohletz

发表

A design for testability study on a high performance automatic gain control circuit

Andrew Richardson, A. Lechner, B. Hermes, 1998, Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231).

Floating body effects model for fault simulation of fully depleted CMOS/SOI circuits

Daniela De Venuto, Michael J. Ohletz, 2003, Microelectron. J..

Digital Window Comparator DfT Scheme for Mixed-Signal ICs

Daniela De Venuto, Bruno Riccò, Michael J. Ohletz, 2002, J. Electron. Test..

Automatic Window Repositioning Technique for Digital Window Comparator Used Within Mixed-Signal Design-for Testability Schemes

Bruno Riccò, Michael J. Ohletz, Daniela Venuto, 2005 .

Realistic faults mapping scheme for the fault simulation of integrated analogue CMOS circuits

Michael J. Ohletz, 1996, Proceedings International Test Conference 1996. Test and Design Validity.

Static and dynamic on-chip test response evaluation using a two-mode comparator

Daniela De Venuto, G. Matarrese, Michael J. Ohletz, 2000, Proceedings IEEE European Test Workshop.

Fault modelling and simulation for the test of integrated analog and mixed-signal circuits

Michael J. Ohletz, 1996 .

Automatic repositioning technique for digital cell based window comparators and implementation within mixed-signal DfT schemes

Daniela De Venuto, Bruno Riccò, Michael J. Ohletz, 2003, Fourth International Symposium on Quality Electronic Design, 2003. Proceedings..

Test of Digital Transversal Filters

F. Matthiesen, Michael J. Ohletz, 1985, ITC.

Automatic fault extraction and simulation of layout realistic faults for integrated analogue circuits

João Paulo Teixeira, Michael J. Ohletz, J. P. Teixeira, 1995, Proceedings the European Design and Test Conference. ED&TC 1995.

Design of Digital Window Comparators and their Implementation within Mixed-Signal DfT Schemes

Bruno Riccò, Daniela De Venuto, Michael J. Ohletz, 2003 .

Fault detection in CMOS/SOI mixed-signal circuits using the quiescent current test

Maher Kayal, D. De Venuto, Michael J. Ohletz, 2002 .

On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages

Daniela De Venuto, Michael J. Ohletz, D. Venuto, 2001, J. Electron. Test..

Self-positioning digital window comparators for mixed-signal DfT

Daniela De Venuto, Bruno Riccò, Michael J. Ohletz, 2003, EFTA 2003. 2003 IEEE Conference on Emerging Technologies and Factory Automation. Proceedings (Cat. No.03TH8696).

Requirements for design, qualification and production of integrated sensor interface circuits for high quality automotive applications

Michael J. Ohletz, F. Schulze, 2007, 2007 2nd International Workshop on Advances in Sensors and Interface.

Testing of analogue circuits via (standard) digital gates

Daniela De Venuto, Bruno Riccò, Michael J. Ohletz, 2002, Proceedings International Symposium on Quality Electronic Design.