W. S. Chen

Evidence and solution of over-RESET problem for HfOX based resistive memory with sub-ns switching speed and high endurance

Frederick T. Chen, W. H. Liu, H. Y. Lee, 2010, 2010 International Electron Devices Meeting.

New Approach to Determine Three-Dimensional Contacts in Blocks System: Penetration Edges Method

W. S. Chen, Y. H. Zhang, Y M Cheng, 2006 .