G. Morin
发表
O. Roux dit Buisson,
G. Morin,
F. Paillardet,
1998,
ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157).
G. Morin,
D. Gloria,
A. Perrotin,
1999,
ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307).
O. Roux dit Buisson,
G. Morin,
1997,
1997 IEEE International Conference on Microelectronic Test Structures Proceedings.