J. Huening

Micro-Raman mapping and analysis of indentation-induced phase transformations in germanium

G. Pharr, R. Nemanich, Jae-il Jang, 2004 .

Electron Beam Probing of Active Advanced FinFET Circuit with Fin Level Resolution

J. Huening, T. Tong, Z. Ma, 2018, ISTFA 2018: Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis.

High-pressure phase transformation of silicon nitride

J. Patten, R. Nemanich, J. Qu, 2003 .

A Comprehensive Approach Towards Optimizing the Xenon Plasma Focused Ion Beam Instrument for Semiconductor Failure Analysis Applications

S. Subramaniam, J. Huening, J. Richards, 2017, Microscopy and Microanalysis.

Silicon Device Backside De-Processing and Fault Isolation Techniques

Wen-hsien Chuang, J. Huening, Prasoon Joshi, 2019, Microelectronics Failure Analysis.

Intrinsic stress effect on fracture toughness of plasma enhanced chemical vapor deposited SiNx:H films

S. King, Guanghai Xu, J. Huening, 2010 .