Joan Marc Rafí

发表

Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs

Cor Claeys, Eddy Simoen, Francesca Campabadal, 2006, Microelectron. Reliab..

Electrical characteristics of high-energy proton irradiated ultra-thin gate oxides

Francesca Campabadal, Celeste Fleta, Joan Marc Rafí, 2002, Microelectron. Reliab..

Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs

Cor Claeys, Eddy Simoen, Kenichiro Takakura, 2005, Microelectron. Reliab..

Degradation of electrical performance and floating body effect in ultra thin gate oxide FD-SOI n-MOSFETs by 7.5-MeV proton irradiation

Cor Claeys, Eddy Simoen, Kenichiro Takakura, 2004, Microelectron. Reliab..

Temperature influence on the generation lifetime determination based on drain current transients in partially depleted SOI nMOSFETs

C. Claeys, Abdelkarim Mercha, Joao Antonio Martino, 2004 .

Impact on the back gate degradation in partially depleted SOI n-MOSFETs by 2-MeV electron irradiation

Cor Claeys, Eddy Simoen, Kenichiro Takakura, 2006, Microelectron. Reliab..

2 MeV electron irradiation effects on the electrical characteristics of MOS capacitors with ALD Al2O3 dielectrics of different thickness

Francesca Campabadal, Kenichiro Takakura, Joan Marc Rafí, 2013, Microelectron. Reliab..

Impact of electrical stress on the electrical characteristics of 2 MeV electron irradiated metal-oxide-silicon capacitors with atomic layer deposited Al2O3, HfO2 and nanolaminated dielectrics

Mireia Bargallo Gonzalez, Francesca Campabadal, Joan Marc Rafí, 2013 .

Electrical stress on irradiated thin gate oxide partially depleted SOI nMOSFETs

Cor Claeys, Eddy Simoen, Francesca Campabadal, 2007 .

Impact of hot-carrier stress on gate-induced floating body effects and drain current transients of thin-gate-oxide partially depleted SOI NMOSFETs

Cor Claeys, Eddy Simoen, Francesca Campabadal, 2005 .

High-energy proton irradiation induced changes in the linear-kink noise overshoot of 0.10 μm partially depleted silicon-on-insulator metal-oxide-semiconductor field-effect transistors

Eddy Simoen, Abdelkarim Mercha, Joan Marc Rafí, 2004 .

Gate induced floating body effects in TiN/SiON and TiN/HfO2 gate stack triple gate SOI nFinFETs

Cor Claeys, Eddy Simoen, Francesca Campabadal, 2007 .

Total ionizing dose damage in deep submicron partially depleted SOI MOSFETs induced by proton irradiation

Eddy Simoen, C. Claeys, Abdelkarim Mercha, 2004 .

What Do We Know about Hydrogen-Induced Thermal Donors in Silicon?

Eddy Simoen, Joan Marc Rafí, Johan Lauwaert, 2009 .

Update on scribe–cleave–passivate (SCP) slim edge technology for silicon sensors: Automated processing and radiation resistance

Maurizio Boscardin, Vitaliy Fadeyev, G.-F. Dalla Betta, 2014 .

Short-channel radiation effect in 60 MeV proton irradiated 0.13 /spl mu/m CMOS transistors

Emmanuel Augendre, Eddy Simoen, C. Claeys, 2003 .

Modeling the breakdown statistics of Al 2 O 3 /HfO 2 nanolaminates grown by atomic-layer-deposition

Jordi Suñé, Francesca Campabadal, Enrique Miranda, 2011 .

Radiation hard silicon detectors—developments by the RD48 (ROSE) collaboration

P. Ciampolini, Shaun Roe, Bruno Sopko, 2001 .

Impact of Radiation-Induced Back-Channel Leakage and Back-Gate Bias on Drain Current Transients of Thin-Gate-Oxide Partially Depleted Silicon-On-Insulator n-channel Metal–Oxide–Semiconductor Field-Effect Transistors

Eddy Simoen, Abdelkarim Mercha, Joan Marc Rafí, 2004 .

Evidence for a linear kink effect in ultra-thin gate oxide SOI MOSFETs

E. Simoen, C. Claeys, Abdelkarim Mercha, 2003 .

Dose rate dependence of the back gate degradation in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation

E. Simoen, C. Claeys, Abdelkarim Mercha, 2007 .

Threshold Switching and Conductance Quantization in Al/HfO2/Si(p) Structures

Jordi Suñé, Francesca Campabadal, Shibing Long, 2012 .