Hidenori Ohyama

发表

Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs

Cor Claeys, Eddy Simoen, Francesca Campabadal, 2006, Microelectron. Reliab..

A new method of SOS epitaxial growth with amorphous Si buffer layer

Makoto Ishida, Yukio Yasuda, Hiroshi Abe, 1983 .

Radiation damages of polycrystalline silicon films and npn Si transistors by high-energy particle irradiation

Cor Claeys, Eddy Simoen, K. Kobayashi, 2001, Microelectron. Reliab..

Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle

Cor Claeys, Eddy Simoen, K. Kobayashi, 2001, Microelectron. Reliab..

Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs

Cor Claeys, Eddy Simoen, Kenichiro Takakura, 2005, Microelectron. Reliab..

Degradation of electrical performance and floating body effect in ultra thin gate oxide FD-SOI n-MOSFETs by 7.5-MeV proton irradiation

Cor Claeys, Eddy Simoen, Kenichiro Takakura, 2004, Microelectron. Reliab..

Impact on the back gate degradation in partially depleted SOI n-MOSFETs by 2-MeV electron irradiation

Cor Claeys, Eddy Simoen, Kenichiro Takakura, 2006, Microelectron. Reliab..

Reliability of polycrystalline silicon thin film resistors

Cor Claeys, Eddy Simoen, K. Kobayashi, 2001, Microelectron. Reliab..

Radiation damage in flash memory cells

Eddy Simoen, Hidenori Ohyama, Corneel Claeys, 2002 .

Impact of lattice defects on the performance degradation of Si photodiodes by high-temperature gamma and electron irradiation

Eddy Simoen, Hidenori Ohyama, Shinobu Onoda, 2001 .

Electrical stress on irradiated thin gate oxide partially depleted SOI nMOSFETs

Cor Claeys, Eddy Simoen, Francesca Campabadal, 2007 .

Induced lattice defects in InGaAs photodiodes by high-temperature electron irradiation

Eddy Simoen, C. Claeys, Hidenori Ohyama, 2003 .

Degradation and recovery of In/sub 0.53/Ga/sub 0.47/As photodiodes by 1-MeV fast neutrons

Hidenori Ohyama, Jan Vanhellemont, Y. Takami, 1996 .

Radiation-induced defects in SiC-MESFETs after 2-MeV electron irradiation

Eddy Simoen, Sumio Matsuda, Hidenori Ohyama, 2006 .

Short-channel radiation effect in 60 MeV proton irradiated 0.13 /spl mu/m CMOS transistors

Emmanuel Augendre, Eddy Simoen, C. Claeys, 2003 .

Strain evaluation of electron irradiated SiGe/Si diodes by Raman spectroscopy

Cor Claeys, Eddy Simoen, Mireia Bargallo Gonzalez, 2010 .

Damage coefficient in high-temperature particle- and γ-irradiated silicon p–i–n diodes

Eddy Simoen, C. Claeys, Sumio Matsuda, 2003 .

Dose rate dependence of the back gate degradation in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation

E. Simoen, C. Claeys, Abdelkarim Mercha, 2007 .