R. L. Mattis

发表

MAESTRO: A Front-End to the MAIN1 Program for Multiple-Angle Measurement of Silicon Dioxide

R. L. Mattis, 1992 .

Semiconductor measurement technology: A FORTRAN program for analysis of data from microelectronic test structures

R. L. Mattis, 1983 .

Design considerations for the cross-bridge sheet resistor

R. L. Mattis, G. P. Carver, M. Buehler, 1982 .

The relationship between resistivity and dopant density for phosphorus-and boron-doped silicon

R. L. Mattis, J. J. Filliben, W. R. Thurber, 1981 .

Resistivity‐Dopant Density Relationship for Phosphorus‐Doped Silicon

R. L. Mattis, J. J. Filliben, W. R. Thurber, 1980 .

Resistivity‐Dopant Density Relationship for Boron‐Doped Silicon

R. L. Mattis, J. J. Filliben, W. R. Thurber, 1980 .

Carrier Lifetime Measurement by the Photoconductive Decay Method

R. L. Mattis, 2017 .