R. Bitar

Effects of the polarity of high‐electric field stressing on power VDMOSFETs parameters

B. Nsouli, R. Bitar, G. Salloum, 2010 .

Switching times variation of MOSFET devices with temperature and high-field stress

R. Habchi, C. Salame, P. Mialhe, 2008, Microelectron. J..