D. Tang

A Wavelet-Based Method for Automatic Location of Peaks in Gamma-Ray Spectra

C. He, Shu Huan Liu, C. Xiong, 2014 .

Time dependent modeling of single particle displacement damage in silicon devices

Peng Zhang, Yonghong Li, Jinxin Zhang, 2016, Microelectron. Reliab..

Soft error reliability in advanced CMOS technologies-trends and challenges

Du Tang, Chaohui He, Yonghong Li, 2014, Science China Technological Sciences.

Soft error reliability in advanced CMOS technologies-trends and challenges

Jinxin Zhang, Yonghong Li, C. He, 2014, Science China Technological Sciences.

3-D simulation study of single event effects of SiGe heterojunction bipolar transistor in extreme environment

Xin Wang, Pei Li, Jinxin Zhang, 2015, Microelectron. Reliab..

Three-dimensional simulation study of bias effect on single event effects of SiGe heterojunction bipolar transistor

X. Wang, P. Li, C. Xiong, 2014 .