K. Esmark
发表
M. Stecher,
H. Gossner,
T. Muller-Lynch,
1999,
Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396).
Gaudenzio Meneghesso,
Paolo Pavan,
Enrico Zanoni,
1999
.
A. Bravaix,
K. Esmark,
T. Brodbeck,
2006,
2006 Electrical Overstress/Electrostatic Discharge Symposium.
G. Groeseneken,
H. Gieser,
M. Etherton,
2004,
2003 Electrical Overstress/Electrostatic Discharge Symposium.
D. Schmitt-Landsiedel,
H. Gossner,
K. Esmark,
2004,
2004 Electrical Overstress/Electrostatic Discharge Symposium.
K. Esmark,
T. Brodbeck,
W. Stadler,
2011,
IEEE Transactions on Device and Materials Reliability.
Integration of high-performance, low-leakage and mixed signal features into a 100 nm CMOS technology
G. Knoblinger,
Yi-Hsiung Lin,
C. Wann,
2002,
2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303).
H. Gossner,
K. Esmark,
W. Stadler,
2005,
2005 Electrical Overstress/Electrostatic Discharge Symposium.
W. Fichtner,
H. Gossner,
K. Esmark,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
D. Schmitt-Landsiedel,
H. Gossner,
K. Esmark,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
M. Wendel,
K. Esmark,
J. Schneider,
2006,
2006 Electrical Overstress/Electrostatic Discharge Symposium.
M. Muhammad,
R. Gauthier,
C. Putnam,
2001,
2001 Electrical Overstress/Electrostatic Discharge Symposium.
W. Fichtner,
K. Esmark,
W. Stadler,
2001,
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
C. Seguin,
Kiran V. Chatty,
R. Halbach,
2007
.
H. Gossner,
K. Esmark,
M. Litzenberger,
2001,
31st European Solid-State Device Research Conference.
Akram A. Salman,
R. Gauthier,
Dimitris E. Ioannou,
2002
.
K. Esmark,
W. Stadler,
D. Pogany,
2007,
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
H. Gossner,
K. Esmark,
C. Furbock,
2000,
30th European Solid-State Device Research Conference.
V. Dubec,
G. Groos,
M. Stecher,
2002,
2002 Electrical Overstress/Electrostatic Discharge Symposium.
M. Stecher,
H. Gossner,
K. Esmark,
2009,
2009 IEEE International Electron Devices Meeting (IEDM).
H. Gossner,
K. Esmark,
S. Bychikhin,
2008,
2008 IEEE International Reliability Physics Symposium.
G. Groos,
M. Stecher,
H. Gossner,
2001,
2001 Electrical Overstress/Electrostatic Discharge Symposium.