Y. V. White

Studies of charge carrier trapping and recombination processes in Si/SiO2/MgO structures using second-harmonic generation

peixiong zhao, D. Fleetwood, R. Mu, 2006 .

Single-pulse ultrafast-laser machining of high aspect nano-holes at the surface of SiO2.

Zbigniew Sikorski, Xiaoxuan Li, L. Davis, 2008, Optics express.

Charge trapping in irradiated SOI wafers measured by second harmonic generation

peixiong zhao, D. Fleetwood, S. Cristoloveanu, 2004, IEEE Transactions on Nuclear Science.

Femtosecond micro- and nano-machining of materials for microfluidic applications

Lloyd M. Davis, William H. Hofmeister, Yelena V. White, 2008, NanoScience + Engineering.

Maximum-likelihood position sensing and actively controlled electrokinetic transport for single-molecule trapping

Lloyd M. Davis, Bruce W. Bomar, Guoqing Shen, 2008, SPIE BiOS.