M.I. Natarajan

发表

Class 3 HBM and class M4 MM ESD protected 5.5 GHz LNA in 90 nm RFCMOS using above-IC inductor

P. Soussan, P. Wambacq, G. Groeseneken, 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium.

Implementation of 6kV ESD Protection for a 17GHz LNA in 130nm SiGeC BiCMOS

G. Carchon, S. Decoutere, D. Linten, 2006, 2006 IEEE International Conference on Semiconductor Electronics.

A traceable method for the arc-free characterization and modeling of CDM testers and pulse metrology chains

H. Reichl, A. Andreini, M.I. Natarajan, 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium.

Advanced modelling and parameter extraction of the MOSFET ESD breakdown triggering in the 90nm CMOS node technologies

G. Groeseneken, M. Steyaert, V. Vassilev, 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.

Design-driven optimisation of a 90 nm RF CMOS process by use of elevated source/drain

P. Wambacq, S. Decoutere, V. Vassilev, 2003, ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003..

Snapback circuit model for cascoded NMOS ESD over-voltage protection structures

J.-J. Yang, V. Vassilev, G. Groeseneken, 2003, ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003..

A 5-GHz fully integrated ESD-protected low-noise amplifier in 90-nm RF CMOS

P. Wambacq, A. Mercha, S. Decoutere, 2004, IEEE Journal of Solid-State Circuits.

Impact of elevated source drain architecture on ESD protection devices for a 90nm CMOS technology node

R. Rooyackers, G. Groeseneken, V. Vassilev, 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium.

ESD protection for a 5.5 GHz LNA in 90 nm RF CMOS — Implementation concepts, constraints and solutions

P. Wambacq, G. Groeseneken, R. Degraeve, 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.

Standardization of the transmission line pulse (TLP) methodology for electrostatic discharge (ESD)

M. Chaine, R. Ashton, L.G. Henry, 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium.

Multilevel Transmission Line Pulse (MTLP) tester

G. Groeseneken, V. Vassilev, S. Thijs, 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.

An integrated 5 GHz low-noise amplifier with 5.5 kV HBM ESD protection in 90 nm RF CMOS

P. Wambacq, A. Mercha, S. Decoutere, 2005, Digest of Technical Papers. 2005 Symposium on VLSI Circuits, 2005..

Co-design methodology to provide high ESD protection levels in the advanced RF circuits

P. Wambacq, G. Groeseneken, M. Steyaert, 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium.

Turn-off characteristics of the CMOS snapback ESD protection devices - new insights and its implications

G. Groeseneken, V.A. Vashchenko, M. Sawada, 2006, 2006 Electrical Overstress/Electrostatic Discharge Symposium.

RFCMOS ESD protection and reliability

M. Sawada, S. Decoutere, D. Linten, 2005, Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005..

A low-cost 90nm RF-CMOS platform for record RF circuit performance

P. Soussan, P. Wambacq, A. Mercha, 2005, Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..