Y. Tagro

In-Situ Silicon Integrated Tuner for Automated On-Wafer MMW Noise Parameters Extraction using Multi-Impedance Method for Transistor Characterization

D. Gloria, Y. Tagro, S. Boret, 2009, 2009 IEEE International Conference on Microelectronic Test Structures.

RF and broadband noise investigation in High‐k/Metal Gate 28‐nm CMOS bulk transistor

Daniel Gloria, Gilles Dambrine, Y. Tagro, 2014 .

RF noise investigation in High-k/Metal Gate 28-nm CMOS transistors

D. Gloria, F. Danneville, G. Dambrine, 2012, 2012 IEEE/MTT-S International Microwave Symposium Digest.

Radio-frequency and low noise characteristics of SOI technology on plastic for flexible electronics

Emmanuel Dubois, Daniel Gloria, Francois Danneville, 2013 .

MMW lab In-Situ to extract noise parameters of 65nm CMOS aiming 70∼90GHz applications

D. Gloria, G. Dambrine, Y. Tagro, 2009, 2009 IEEE Radio Frequency Integrated Circuits Symposium.

In-situ silicon integrated tuner for automated on-wafer MMW noise parameters extraction of Si HBT and MOSFET in the range 60–110GHz

D. Gloria, G. Dambrine, Y. Tagro, 2008, 2008 72nd ARFTG Microwave Measurement Symposium.

SiGe HBT noise parameters extraction using in-situ silicon integrated tuner in MMW range 60–110GHz

D. Gloria, G. Dambrine, Y. Tagro, 2009, 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting.

A converging route towards very high frequency, mechanically flexible, and performance stable integrated electronics

Emmanuel Dubois, Daniel Gloria, Francois Danneville, 2013 .

Sub-1-dB Minimum-Noise-Figure Performance of GaN-on-Si Transistors Up to 40 GHz

D. Ducatteau, F. Danneville, N. Rolland, 2012, IEEE Electron Device Letters.