Y. Morandini

In-Situ Silicon Integrated Tuner for Automated On-Wafer MMW Noise Parameters Extraction using Multi-Impedance Method for Transistor Characterization

D. Gloria, Y. Tagro, S. Boret, 2009, 2009 IEEE International Conference on Microelectronic Test Structures.

Multiport de-embedding technique for balanced varactor high frequency characterization

D. Gloria, S. Boret, Y. Morandini, 2009, 2009 European Microwave Conference (EuMC).

Silicon high frequency test structures improvement for millimeter wave varactors characterization optimization and modeling

C. Gaquiere, D. Gloria, Y. Morandini, 2011, 2011 IEEE ICMTS International Conference on Microelectronic Test Structures.

Evaluation of sub-32nm CMOS technology for Millimeter wave applications

F. Gianesello, D. Gloria, S. Boret, 2010, The 40th European Microwave Conference.

Characterization and Model Parameter Extraction of Symmetrical Centre Tapped Inductor using Build in Mixed Mode and Pure Differential S-Parameters

F. Gianesello, D. Gloria, S. Boret, 2009, 2009 IEEE International Conference on Microelectronic Test Structures.

In-situ silicon integrated tuner for automated on-wafer MMW noise parameters extraction of Si HBT and MOSFET in the range 60–110GHz

D. Gloria, G. Dambrine, Y. Tagro, 2008, 2008 72nd ARFTG Microwave Measurement Symposium.

High Frequency Characterization of Compact N+Poly/Nwell Varactor Using Waffle-Layout

C. Gaquiere, Y. Morandini, J.-F. Larchanche, 2008, 2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems.

Differential P+/Nwell varactor High Frequency Characterization

C. Gaquiere, Y. Morandini, J.-F. Larchanche, 2007, 2007 IEEE International Conference on Microelectronic Test Structures.

Optical high frequency test structure and test bench definition for on wafer silicon integrated noise source characterization up to 110 GHz based on Germanium-on-Silicon photodiode

G. Ducournau, D. Gloria, F. Danneville, 2013, 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS).