G. Dambrine

In-Situ Silicon Integrated Tuner for Automated On-Wafer MMW Noise Parameters Extraction using Multi-Impedance Method for Transistor Characterization

D. Gloria, Y. Tagro, S. Boret, 2009, 2009 IEEE International Conference on Microelectronic Test Structures.

90nm SOI-CMOS of 150GHz f/sub max/ and 0.8dB NF/sub min/ @6GHz for SOC

O. Rozeau, R. Gwoziecki, C. Raynaud, 2002, 2002 IEEE International SOI Conference.