Bartek Pawlak

Thejunction challenges intheFinFETsdevice

Wilfried Vandervorst, Gerben Doornbos, Bartek Pawlak, 2006 .

Material Aspects and Challenges for SOI FinFET Integration

Rita Rooyackers, Liesbeth Witters, Nadine Collaert, 2008 .

Advanced FinFET Devices for Sub-32nm Technology Nodes: Characteristics and Integration Challenges

Rita Rooyackers, Anabela Veloso, Liesbeth Witters, 2009 .

Multi-gate devices for the 32 nm technology node and beyond

Rita Rooyackers, Nadine Collaert, Isabelle Ferain, 2008 .

Impact of Ni-silicide grain orientation on the strain and stress fields induced in patterned silicon

Karen Maex, Hugo Bender, Jorge Kittl, 2007 .

Implantation for an Excellent Definition of Doping Profiles in Si Solar Cells

Niels Posthuma, Jef Poortmans, Bartek Pawlak, 2010 .