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Experimental study on the single event effects in pulse width modulators by laser testing
陈伟, 郭晓强, 王汉宁, 2015 .
System and method for detecting single event upset a memory
陈伟, 肖尧, 郭晓强, 2015 .
Impacts of test factors on heavy ion single event multiple-cell upsets in nanometer-scale SRAM
肖尧, 赵雯, 郭红霞, 2015 .