Yuzhe Zhao
发表
P. K. Tan,
Binghai Liu,
C. Fu,
2018,
AIP Advances.
P. K. Tan,
Z. Mai,
J. Lam,
2018,
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
P. K. Tan,
Xintong Zhu,
H. Tan,
2019,
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA).
Ran He,
Hao Tan,
Pik Kee Tan,
2018,
Microelectronics and reliability.
L. Zhu,
Ran He,
Hao Tan,
2016,
Microelectron. Reliab..
P. K. Tan,
D. Houssameddine,
T. Tahmasebi,
2018,
Acta Materialia.
P. K. Tan,
Yanlin PAN,
Yuzhe ZHAO,
2019,
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA).
Z. Dong,
Binghai Liu,
Z. Mo,
2020
.
S. M. Parab,
P. K. Tan,
Yanlin PAN,
2019,
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA).
Pik Kee Tan,
Jeffrey Lam,
Binghai Liu,
2018,
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Yi Chao Low,
Pik Kee Tan,
Soon Leng Tan,
2018,
Microelectron. Reliab..
Pik Kee Tan,
Yuzhe Zhao,
Zhihong Mai,
2018,
Microelectron. Reliab..