Joel Molina Reyes

Influence of the surface roughness of the bottom electrode on the resistive-switching characteristics of Al/Al2O3/Al and Al/Al2O3/W structures fabricated on glass at 300 °C

Alfonso Torres-Jácome, Joel Molina Reyes, Rene Valderrama, 2014, Microelectron. Reliab..

Non-homogeneous space mechanical strain induces asymmetrical magneto-tunneling conductance in MOSFETs

Joel Molina Reyes, Edmundo A. Gutierrez-D, A. Erika Pondigo de los, 2014, 2014 44th European Solid State Device Research Conference (ESSDERC).

Degradation of high-K LA2O3 gate dielectrics using progressive electrical stress

Hiroshi Iwai, Enrique Miranda, Y. Kim, 2005, Microelectron. Reliab..

A smart transduction system with PVTA compensation for sensing applications

Guillermo Espinosa Flores-Verdad, Joel Molina Reyes, Luis A. Carrillo-Martinez, 2015, 2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS).

Effect of changing the material and device's properties on the performance of polysilicon-based MicroActuators

Mónico Linares Aranda, Joel Molina Reyes, Wilfrido Calleja Arriaga, 2013, CCE.

Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms

Nagarajan Raghavan, Kin Leong Pey, Andrea Padovani, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).

Electrochemical Characterization of Ion-Sensitive Capacitors with ALD Al2O3 as the Sensitive Dielectric

Joel Molina Reyes, Berni Manolo Perez Ramos, 2014 .

Analysis of quantum conductance, read disturb and switching statistics in HfO2 RRAM using conductive AFM

Nagarajan Raghavan, Alok Ranjan, Kin Leong Pey, 2016, Microelectron. Reliab..

Understanding the Resistive Switching Phenomena of Stacked Al/Al2O3/Al Thin Films from the Dynamics of Conductive Filaments

Luis Hernández-Martínez, Joel Molina Reyes, 2017, Complex..

Carrier separation and Vth measurements of W-La2O3 gated MOSFET structures after electrical stress

Hiroshi Iwai, Nobuyuki Sugii, Kuniyuki Kakushima, 2007, IEICE Electron. Express.

Room temperature resonant tunneling in metal-insulator-insulator-insulator-semiconductor devices

Joel Molina Reyes, H. Uribe-Vargas, 2018, 2018 76th Device Research Conference (DRC).

Chemical analysis of thin ALD-Al2O3 films and their applications as pH-sensitive layers in CMOS-compatible Ion-Sensitive Capacitors (ISCAP)

Joel Molina Reyes, Berni Manolo Perez Ramos, Alejandro Sánchez, 2015 .