W.-B. Jone

Fault Detection and Diagnosis for Multi-Level Cell Flash Memories

R.R. Martin, W.-B. Jone, Sunil Das, 2006, 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings.

Improved Test Efficiency in Cores-Based System-on-Chips Using ModelSim Verification Tool

E.M. Petriu, S.R. Das, W.-B. Jone, 2008, 2008 IEEE Instrumentation and Measurement Technology Conference.

Design and design automation of rectification logic for engineering change

Shih-Chieh Chang, Cheng-Hung Lin, W.-B. Jone, 2005, Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005..

Fault simulation and response compaction in full scan circuits using HOPE

E.M. Petriu, W.-B. Jone, M.H. Assaf, 2002, IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276).