G. Kamarinos

发表

Effects of hydrogenation on the performance and stability of p-channel polycrystalline silicon thin-film transistors

C. A. Dimitriadis, N. A. Hastas, F. V. Farmakis, 2003, Microelectron. Reliab..

Effects of gamma-ray irradiation on polycrystalline silicon thin-film transistors

C. A. Dimitriadis, N. A. Hastas, G. Kamarinos, 2003, Microelectron. Reliab..

Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors

C. A. Dimitriadis, G. Kamarinos, Dimitrios H. Tassis, 2006, Microelectron. Reliab..

Effects of hot carriers in offset gated polysilicon thin-film transistors

C. A. Dimitriadis, G. Kamarinos, Dimitrios H. Tassis, 2006, Microelectron. Reliab..

Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress

C. A. Dimitriadis, G. Kamarinos, Dimitrios H. Tassis, 2008, Microelectron. Reliab..

Hysteresis effect in bottom-gate polymorphous silicon thin-film transistors

C. A. Dimitriadis, N. A. Hastas, G. Kamarinos, 2011, Microelectron. Reliab..

Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors

Adonios Thanailakis, C. A. Dimitriadis, N. A. Hastas, 2005, Microelectron. Reliab..

On the recombination behaviour of iron in moderately boron-doped p-type silicon

G. Kamarinos, G. Kamarinos, D. Walz, 1996 .

An analytical hot-carrier induced degradation model in polysilicon TFTs

G. Kamarinos, A.T. Hatzopoulos, G. Kamarinos, 2005, IEEE Transactions on Electron Devices.

On-state drain current modeling of large-grain poly-Si TFTs based on carrier transport through latitudinal and longitudinal grain boundaries

G. Kamarinos, A.T. Hatzopoulos, G. Kamarinos, 2005, IEEE Transactions on Electron Devices.

Study of the Drain Leakage Current in Bottom-Gated Nanocrystalline Silicon Thin-Film Transistors by Conduction and Low-Frequency Noise Measurements

G. Kamarinos, N. Arpatzanis, A.T. Hatzopoulos, 2007, IEEE Transactions on Electron Devices.

Effect of Channel Width on the Electrical Characteristics of Amorphous/Nanocrystalline Silicon Bilayer Thin-Film Transistors

G. Kamarinos, N. Arpatzanis, A.T. Hatzopoulos, 2007, IEEE Transactions on Electron Devices.

Effects of hydrogenation on the performance and hot-carrier endurance of polysilicon thin-film transistors

G. Kamarinos, J. Brini, C.A. Dimitriadis, 2001, IEEE Electron Device Letters.

Anomalous turn-on voltage degradation during hot-carrier stress in polycrystalline silicon thin-film transistors

G. Kamarinos, J. Brini, G. Kamarinos, 2001, IEEE Electron Device Letters.