P. Dudek

发表

Dielectric characteristics of amorphous and crystalline BaHfO3 high-k layers on TiN for memory capacitor applications

C. Wenger, J. Dabrowski, G. Lippert, 2008, 2008 9th International Conference on Ultimate Integration of Silicon.

Hf- and Zr-based alkaline earth perovskite dielectrics for memory applications

H. Müssig, G. Lippert, G. Łupina, 2009 .

Deposition of BaHfO3 Dielectric Layers for Microelectronic Applications by Pulsed Liquid Injection MOCVD

C. Wenger, T. Katkus, Raimondas Galvelis, 2009 .

Basic investigation of HfO2 based metal–insulator–metal diodes

C. Wenger, A. Devi, M. Albert, 2011 .

Dielectric breakdown in polycrystalline hafnium oxide gate dielectrics investigated by conductive atomic force microscopy

Marc Porti, Xavier Aymerich, Montserrat Nafría, 2011 .

Optical properties and band gap characterization of high dielectric constant oxides

C. Wenger, P. Zaumseil, G. Lupina, 2012 .

Some aspects of gaseous hydrogen storage and the performance of a 10-kW Polymer Electrolyte Membrane Fuel Cells stack as part of a hybrid power source

M. Dudek, P. Wygonik, M. Korkosz, 2019, IOP Conference Series: Earth and Environmental Science.

Dielectric and structural properties of thin SrHfO3 layers on TiN

H. Müssig, G. Lippert, G. Lupina, 2008 .

Thin BaHfO3 high-k dielectric layers on TiN for memory capacitor applications

C. Wenger, P. Zaumseil, C. Walczyk, 2008 .

Atomic-scale engineering of future high-k dynamic random access memory dielectrics: The example of partial Hf substitution by Ti in BaHfO3

E. Zschech, P. Zaumseil, T. Schroeder, 2011 .

Correlation between the nanoscale electrical and morphological properties of crystallized hafnium oxide-based metal oxide semiconductor structures

Marc Porti, Xavier Aymerich, Montserrat Nafría, 2010 .