D. Spasov

The effect of gate material on dielectric characteristics and conduction mechanism of Ta/sub 2/O/sub 5/ MOS structures

E. Atanassova, N. Novkovski, M. Pecovska-Gjorgjevich, 2004, Proceedings of the 2004 IEEE International Conference on Solid Dielectrics, 2004. ICSD 2004..

Structural and electrical properties of Nb doped TiO2 films prepared by the sol–gel layer-by-layer technique

A. Szekeres, S. Preda, M. Gartner, 2016 .

Electrical characterization of In-N codoped p-type ZnO films grown by chemical methods

A. Szekeres, M. Anastasescu, M. Gartner, 2014 .

Thermal Ta2O5--alternative to SiO2 for storage capacitor application

Elena Atanassova, Dejan Spasov, E. Atanassova, 2002, Microelectron. Reliab..

DIELECTRIC CHARACTERISTICS AND RELIABILITY TESTS FOR THIN Au-Ta2O5-SiO2-Si STRUCTURES

E. Atanassova, N. Novkovski, M. Pecovska-Gjorgjevich, 2005 .