C. Dufaza

Test structure for I/sub C/(V/sub BE/) parameter determination of low voltage applications

W. Rahajandraibe, D. Auvergne, C. Dufaza, 2002, Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition.

On chip measurement of I/sub C/(V/sub BE/) characteristics for high accuracy bandgap applications

W. Rahajandraibe, D. Auvergne, C. Dufaza, 2002, Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611).

Very low power high temperature stability bandgap reference voltage

W. Rahajandraibe, D. Auvergne, C. Dufaza, 2008, Proceedings of the 28th European Solid-State Circuits Conference.

Dynamic digital integrated circuit testing using oscillation-test method

K. Arabi, B. Kaminska, C. Dufaza, 1998 .