Scott R. Wilson

Ion beam milling of fused silica for window fabrication

John R. McNeil, Scott R. Wilson, David W. Reicher, 1991, Laser Damage.

Wafer examination and critical dimension estimation using scattered light

S. Sohail H. Naqvi, John R. McNeil, Richard H. Krukar, 1992, Electronic Imaging.

Photoacoustic characterization of surface absorption

John R. McNeil, Scott R. Wilson, David W. Reicher, 1991, Laser Damage.