G. Donadio
发表
L. Goux,
C. Detavernier,
S. Clima,
2022,
Thin Solid Films.
Insight Into the Mechanism of Tail Bits in Data Retention of Vacancy-Modulated Conductive Oxide RRAM
L. Goux,
G. Kar,
A. Belmonte,
2018,
IEEE Electron Device Letters.
P. Debacker,
A. Mocuta,
A. Furnemont,
2017,
2017 Symposium on VLSI Technology.
L. Goux,
G. Kar,
A. Belmonte,
2020
.
L. Goux,
G. Kar,
K. Opsomer,
2020,
physica status solidi (RRL) – Rapid Research Letters.
R. Delhougne,
R. Degraeve,
L. Goux,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
Gian Francesco Lorusso,
Naoto Horiguchi,
Christopher J. Wilson,
2017,
Advanced Lithography.
D. Tsvetanova,
H. Dekkers,
A. Chasin,
2021,
2021 Symposium on VLSI Technology.
Diana Tsvetanova,
Arnaud Furnemont,
Davide Crotti,
2016,
IEEE Transactions on Magnetics.
D. Tsvetanova,
H. Dekkers,
A. Chasin,
2020,
2020 IEEE International Electron Devices Meeting (IEDM).
R. Degraeve,
S. Clima,
A. Fantini,
2023,
IEEE Transactions on Electron Devices.
M. Rosmeulen,
Z. Tao,
S. Ramesh,
2023,
International Memory Workshop.
M. Rosmeulen,
D. Verreck,
G. V. D. Bosch,
2022,
2022 IEEE International Memory Workshop (IMW).
L. Goux,
B. Govoreanu,
J. Van Houdt,
2018,
2018 IEEE Symposium on VLSI Technology.