Taiwan Roc
发表
Su-Hsien Chang,
M. Lin,
P. Chao,
2014
.
Origin of defects responsible for charge transport in resistive random access memory based on hafnia
E. V. Ivanova,
Novosibirsk,
Russia.,
2013,
1309.0071.
B. Ambedkar,
Taiwan Roc,
2013
.
Jaw-Yen Yang,
I-Nan Tsai,
Taiwan Roc,
1997
.
Eric Min-yang Wang,
Taiwan Roc,
Yu-hung Chi,
2015
.
Jong-Yih Kuo,
Taiwan Roc,
Wei Xiou Lin,
2007
.
Taiwan Roc,
Taiwan Roc,
1997
.