Weiping Shi

Researchon DC BiasDue toMagnetic Storm

Zongqi Liu, Lianguang Liu, Weiping Shi, 2005 .

Impact of photolithography and mask variability on interconnect parasitics

M. R. Mercer, Weiping Shi, Yuxin Tian, 2005, SPIE Photomask Technology.

Research on DC Bias Due to Magnetic Storm and DC Transmission

Lianguang Liu, Qian Wang, Weiping Shi, 2005, 2005 IEEE/PES Transmission & Distribution Conference & Exposition: Asia and Pacific.