Kevin Kjoller

Alternating PSM mask performance: a study of multiple fabrication technique results

Martin McCallum, Patricia Gabella, Gilbert V. Shelden, 2001, SPIE Advanced Lithography.

Nano-spectroscopy in the 2.5-10 μm wavelength range using atomic force microscope

Konstantin L. Vodopyanov, Dqm Craig, James H. Rice, 2009 .

Nanoscale chemical composition mapping of polymers at 100nm spatial resolution with AFM-based IR spectroscopy

Kevin Kjoller, Michael Lo, Alexandre Dazzi, 2012, Defense, Security, and Sensing.

Spatial Differentiation of Sub-Micrometer Domains in a Poly(Hydroxyalkanoate) Copolymer Using Instrumentation That Combines Atomic Force Microscopy (AFM) and Infrared (IR) Spectroscopy

Curtis Marcott, Kevin Kjoller, Isao Noda, 2011, Applied spectroscopy.

Nanoscale mid-infrared imaging of phase separation in a drug-polymer blend.

Curtis Marcott, Kevin Kjoller, Bernard Van Eerdenbrugh, 2012, Journal of pharmaceutical sciences.

Direct measurement of tapping force with a cantilever deflection force sensor.

Chanmin Su, Kevin Kjoller, C. Su, 2004, Ultramicroscopy.

Low‐cost modification of a contact atomic force microscope (AFM) into a sound‐activated tapping mode AFM for use in air and liquids

Kevin Kjoller, Louis Hellemans, K. Kjoller, 1996 .

Absorption spectroscopy and imaging from the visible through mid-infrared with 20 nm resolution.

Kevin Kjoller, Andrea Centrone, A. Centrone, 2015, Analytical chemistry.

Nanoscale infrared (IR) spectroscopy and imaging of structural lipids in human stratum corneum using an atomic force microscope to directly detect absorbed light from a tunable IR laser source

Curtis Marcott, Guive Balooch, Kevin Kjoller, 2013, Experimental dermatology.