Jens Leenstra

发表

Sang H. Dhong, H. Peter Hofstee, Joel Silberman, 2007, IBM J. Res. Dev..

Balaram Sinharoy, Joshua Friedrich, Jens Leenstra, 2010, 2010 IEEE International Conference on Integrated Circuit Design and Technology.

Juergen Pille, Jens Leenstra, Stefan Büttner, 2006, Proceedings of the Design Automation & Test in Europe Conference.

Hans-Joachim Wunderlich, Christian G. Zoellin, Jens Leenstra, 2006, 2006 IEEE International Test Conference.

Sam Lightstone, Ippokratis Pandis, Guy M. Lohman, 2013, Proc. VLDB Endow..

Balaram Sinharoy, Charles F. Marino, Eric E. Retter, 2011 .

Tobias Gemmeke, Jens Leenstra, Joachim Fenkes, 2007, J. Low Power Electron..

Matthew M. Ziegler, Victor V. Zyuban, George Gristede, 2014, Proceedings of the IEEE 2014 Custom Integrated Circuits Conference.

Eric M. Schwarz, Silvia M. Müller, Christian Jacobi, 2007, IBM J. Res. Dev..

Lambert Spaanenburg, Jens Leenstra, 1991, 1991, Proceedings. International Test Conference.

Balaram Sinharoy, Victor V. Zyuban, Gaurav Mittal, 2011, IEEE Journal of Solid-State Circuits.

Hans-Joachim Wunderlich, Michael E. Imhof, Christian G. Zoellin, 2007, 2007 44th ACM/IEEE Design Automation Conference.

Kevin J. Nowka, Sang H. Dhong, H. Peter Hofstee, 2000, IBM J. Res. Dev..

Lambert Spaanenburg, Jens Leenstra, 1990, Proceedings. International Test Conference 1990.

Balaram Sinharoy, Bruce G. Mealey, Thomas Pflueger, 2015, IBM J. Res. Dev..

Gundolf Kiefer, Hans-Joachim Wunderlich, Jens Leenstra, 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

Hans-Joachim Wunderlich, Michael E. Imhof, Melanie Elm, 2008, 2008 45th ACM/IEEE Design Automation Conference.

Lambert Spaanenburg, Jens Leenstra, 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.

Michael Gschwind, Tejas Karkhanis, José E. Moreira, 2015, IBM J. Res. Dev..