Ch. Thomas

Characterization of electronic materials and devices by scanning near-field microscopy

L. Balk, R. Heiderhoff, J. Phang, 2007 .

200 femtometer sensitivity for near-field analysis of surface acoustic waves in a scanning electron / scanning probe microscope hybrid system

L. Balk, R. Heiderhoff, Ch. Thomas, 2007 .

NANOSCOPIC EVALUATION OF MICROSYSTEMS

L. Balk, R. Heiderhoff, H. Hartnagel, 2004 .

Polarization in Wide Bandgap Semiconductors and their Characterization by Scanning Probe Microscopy

M. Chandrashekhar, M. Spencer, G. Koley, 2008 .

Electron-beam-induced potentials in semiconductors: calculation and measurement with an SEM/SPM hybrid system

Ludwig Josef Balk, Ralf Heiderhoff, L. Balk, 2004 .

Acoustic near-field conditions in an ESEM/AFM hybrid system

Ludwig Josef Balk, Ralf Heiderhoff, L. Balk, 2007 .