K. Ramakrishnan

Thermal neutron induced soft error rate measurement in semiconductor memories and circuits

R. Rajaraman, V. Narayanan, C. Celik, 2008 .

Thermal-aware reliability analysis for Platform FPGAs

Narayanan Vijaykrishnan, Yuan Xie, Sungmin Bae, 2008, 2008 IEEE/ACM International Conference on Computer-Aided Design.

A novel Si-Tunnel FET based SRAM design for ultra low-power 0.3V VDD applications

Dhiraj K. Pradhan, Narayanan Vijaykrishnan, Jawar Singh, 2010, 2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC).

New-Age: A Negative Bias Temperature Instability-Estimation Framework for Microarchitectural Components

Yu Wang, Narayanan Vijaykrishnan, Yu Cao, 2009, International Journal of Parallel Programming.

A framework for estimating NBTI degradation of microarchitectural components

Yu Wang, Narayanan Vijaykrishnan, Yu Cao, 2009, 2009 Asia and South Pacific Design Automation Conference.

Process-Variation-Aware Adaptive Cache Architecture and Management

Mahmut T. Kandemir, Narayanan Vijaykrishnan, Mary Jane Irwin, 2009, IEEE Transactions on Computers.

Variation Impact on SER of Combinational Circuits

Narayanan Vijaykrishnan, Mary Jane Irwin, Yuan Xie, 2007, 8th International Symposium on Quality Electronic Design (ISQED'07).

Toward Increasing FPGA Lifetime

Narayanan Vijaykrishnan, Mary Jane Irwin, Yuan Xie, 2008, IEEE Transactions on Dependable and Secure Computing.