M. Valenza
发表
F. Martinez,
Alain Hoffmann,
Cédric Leyris,
2007,
Microelectron. Reliab..
F. Martinez,
Alain Hoffmann,
Cédric Leyris,
2007,
Microelectron. Reliab..
A. Hoffmann,
D. Sodini,
A. Laigle,
2004
.
M. Valenza,
D. Rigaud,
J. Rhayem,
2002
.
Alain Hoffmann,
M. Valenza,
T. Contaret,
2001
.
M. Valenza,
F. Martinez,
2007,
SPIE International Symposium on Fluctuations and Noise.
M. Valenza,
J. C. Vildeuil,
D. Rigaud,
1999,
ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307).
O. Faynot,
F. Andrieu,
F. Martinez,
2013
.
O. Faynot,
S. Cristoloveanu,
B. Iniguez,
2011,
Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011.
Stephen S. Murray,
Almus T. Kenter,
Randall W. Moore,
1993,
Optics & Photonics.
M. Marin,
Alain Hoffmann,
M. Valenza,
2003,
SPIE International Symposium on Fluctuations and Noise.
Alain Hoffmann,
M. Valenza,
C. Leyris,
2005,
SPIE International Symposium on Fluctuations and Noise.
Frédéric Boeuf,
K. Rochereau,
F. Martinez,
2007,
Microelectron. Reliab..
M. Valenza,
C. Leyris,
F. Martinez,
2006,
2006 IEEE International Conference on Microelectronic Test Structures.
M. Valenza,
J. C. Vildeuil,
D. Rigaud,
2000
.
P. Llinares,
M. Valenza,
J. C. Vildeuil,
2002
.
F. Roy,
A. Hoffmann,
M. Valenza,
2006,
2006 International Caribbean Conference on Devices, Circuits and Systems.
T. Ducourant,
M. Valenza,
D. Rigaud,
1996
.
Alain Hoffmann,
M. Valenza,
D. Rigaud,
2001
.
Emmanuel Augendre,
K. Romanjek,
M. Valenza,
2009
.
Annick Penarier,
C. Delseny,
S. Jarrix,
2002
.
F. Roy,
Alain Hoffmann,
M. Valenza,
2005
.
M. Valenza,
D. Rigaud,
1994
.
Olivier Bonnaud,
A. Mercha,
R. Carin,
2000
.
M. Valenza,
J. C. Vildeuil,
D. Rigaud,
1999
.
M. Valenza,
D. Rigaud,
J. Rhayem,
2000
.
M. Valenza,
D. Rigaud,
J. Rhayem,
1999
.
Frederic Boeuf,
Thomas Skotnicki,
B. Tavel,
2005
.
O. Faynot,
R. Ritzenthaler,
B. Iniguez,
2011
.